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Number of items: 4.

A

Arnold, Donna C., O'Callaghan, J.M., Sexton, A., Tobin, J.M., Amenitsch, H., Holmes, J.D., Morris, M.A. (2009) The role of etched silicon channels on the pore ordering of mesoporous silica: The importance of film thickness on providing highly orientated and defect-free thin films. Applied Surface Science, 255 (23). pp. 9333-9342. ISSN 0169 4332. (doi:10.1016/j.apsusc.2009.07.031) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:49065)

L

Liu, Wenbin, Forbes, R.G. (1995) Modelling the link between emission current and LMIS cusp length. Applied Surface Science, 87-88 . pp. 122-126. ISSN 0169-4332. (doi:10.1016/0169-4332(94)00528-1) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:36799)

P

Prutton, M., Wilkinson, D.K., Kenny, Peter G., Mountain, David (1999) Data processing for spectrum-images: extracting information from the data mountain. Applied Surface Science, 144-14 . pp. 1-10. (doi:10.1016/S0169-4332(98)00754-5) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:16501)

Y

Yaicle, C., Blacklocks, Aran N., Chadwick, Alan V., Perriere, J., Rougier, A. (2007) Relationship between structure and deposition conditions for CuInO2 thin films. Applied Surface Science, 254 (4). pp. 1343-1346. ISSN 0169-4332. (doi:10.1016/j.apsusc.2007.08.016) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided) (KAR id:2821)

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