Browse by Journal
Number of items: 4.
2009
Arnold, Donna C., O'Callaghan, J.M., Sexton, A., Tobin, J.M., Amenitsch, H., Holmes, J.D., Morris, M.A. (2009) The role of etched silicon channels on the pore ordering of mesoporous silica: The importance of film thickness on providing highly orientated and defect-free thin films. Applied Surface Science, 255 (23). pp. 9333-9342. ISSN 0169 4332. (doi:10.1016/j.apsusc.2009.07.031) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:49065) |
2007
Yaicle, C., Blacklocks, Aran N., Chadwick, Alan V., Perriere, J., Rougier, A. (2007) Relationship between structure and deposition conditions for CuInO2 thin films. Applied Surface Science, 254 (4). pp. 1343-1346. ISSN 0169-4332. (doi:10.1016/j.apsusc.2007.08.016) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided) (KAR id:2821) |
1999
Prutton, M., Wilkinson, D.K., Kenny, Peter G., Mountain, David (1999) Data processing for spectrum-images: extracting information from the data mountain. Applied Surface Science, 144-14 . pp. 1-10. (doi:10.1016/S0169-4332(98)00754-5) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:16501) |
1995
Liu, Wenbin, Forbes, R.G. (1995) Modelling the link between emission current and LMIS cusp length. Applied Surface Science, 87-88 . pp. 122-126. ISSN 0169-4332. (doi:10.1016/0169-4332(94)00528-1) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:36799) |