Prutton, M., Wilkinson, D.K., Kenny, Peter G., Mountain, David (1999) Data processing for spectrum-images: extracting information from the data mountain. Applied Surface Science, 144-14 . pp. 1-10. (doi:10.1016/S0169-4332(98)00754-5) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:16501)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: http://dx.doi.org/10.1016/S0169-4332(98)00754-5 |
Abstract
Several analytical methods of electron, X-ray and ion microscopy are now capable of generating images containing an entire spectrum at each pixel. These spectrum-images require new software tools for visualisation, classification and analysis. This paper outlines a new method of visualisation for spectrum-images and two image classification methods that can be used to identify the phases present in the sample.
Item Type: | Article |
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DOI/Identification number: | 10.1016/S0169-4332(98)00754-5 |
Additional information: | Also presented at: Event title: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis Event location: Birmingham, England Event dates: Aug 31-Sep 04, 1998 |
Uncontrolled keywords: | image processing; scanning electron microscopy; Auger electron spectroscopy; metal-semiconductor interfaces |
Subjects: |
Q Science Q Science > QD Chemistry Q Science > QC Physics |
Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Computing |
Depositing User: | F.D. Zabet |
Date Deposited: | 22 Apr 2009 11:51 UTC |
Last Modified: | 05 Nov 2024 09:51 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/16501 (The current URI for this page, for reference purposes) |
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