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W

Wu, Shaomin, Wan, Dejun, Huang, Ren (1995) Function Process and Reliability Analysis of a Two-dependent-unit System. Microelectronics Reliability, 35 (4). pp. 743-747. ISSN 0026-2714. (doi:10.1016/0026-2714(95)93183-B) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:32008)

Wu, Shaomin, Huang, Ren, Wan, Dejun (1994) Reliability Analysis of a Repairable System without being Repaired "As Good as New". Microelectronics Reliability, 34 (2). pp. 357-360. ISSN 0026-2714. (doi:10.1016/0026-2714(94)90117-1) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:32009)

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