Wu, Shaomin, Wan, Dejun, Huang, Ren (1995) Function Process and Reliability Analysis of a Two-dependent-unit System. Microelectronics Reliability, 35 (4). pp. 743-747. ISSN 0026-2714. (doi:10.1016/0026-2714(95)93183-B) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:32008)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1016/0026-2714(95)93183-B |
Abstract
In this paper, a two-dependent-unit system is discussed. We assume that the life distribution of the two units is a two-dimensional exponential distribution, and the repair distributions are general distributions, respectively, and the failure unit cannot be repaired “as good as new”. By using a function process, some reliability indices are derived.
| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.1016/0026-2714(95)93183-B |
| Subjects: |
H Social Sciences H Social Sciences > HA Statistics > HA33 Management Science |
| Divisions: | Divisions > Kent Business School - Division > Department of Analytics, Operations and Systems |
| Depositing User: | Shaomin Wu |
| Date Deposited: | 29 Oct 2012 12:29 UTC |
| Last Modified: | 05 Nov 2024 10:14 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/32008 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Wu, Shaomin.
| Creator's ORCID: |
 https://orcid.org/0000-0001-9786-3213
|
|---|---|
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