Function Process and Reliability Analysis of a Two-dependent-unit System

Wu, Shaomin and Wan, Dejun and Huang, Ren (1995) Function Process and Reliability Analysis of a Two-dependent-unit System. Microelectronics Reliability, 35 (4). pp. 743-747. ISSN 0026-2714. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1016/0026-2714(95)93183-B

Abstract

In this paper, a two-dependent-unit system is discussed. We assume that the life distribution of the two units is a two-dimensional exponential distribution, and the repair distributions are general distributions, respectively, and the failure unit cannot be repaired “as good as new”. By using a function process, some reliability indices are derived.

Item Type: Article
Subjects: H Social Sciences
H Social Sciences > HA Statistics > HA33 Management Science
Divisions: Faculties > Social Sciences > Kent Business School
Faculties > Social Sciences > Kent Business School > Management Science
Depositing User: Shaomin Wu
Date Deposited: 29 Oct 2012 12:29
Last Modified: 17 Apr 2014 09:36
Resource URI: https://kar.kent.ac.uk/id/eprint/32008 (The current URI for this page, for reference purposes)
  • Depositors only (login required):

Downloads

Downloads per month over past year