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1997
Batchelor, John C., Langley, Richard J. (1997) Beam scanning using microstrip line on biased ferrite. Electronics Letters, 33 (8). pp. 645-646. ISSN 0013-5194. (doi:10.1049/el:19970459) (KAR id:18277) |
Batchelor, John C., Langley, Richard J. (1997) Beam scanning using microstrip line on biased ferrite. Electronics Letters, 33 (8). pp. 645-646. ISSN 0013-5194. (doi:10.1049/el:19970459) (KAR id:18277) |