Beam scanning using microstrip line on biased ferrite

Batchelor, John C. and Langley, Richard J. (1997) Beam scanning using microstrip line on biased ferrite. Electronics Letters, 33 (8). pp. 645-646. ISSN 0013-5194. (Full text available)

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Abstract

The beam scanning properties of a 2-element patch array fed by a microstrip reed situated on a ferrite substrate are presented. Biasing the ferrite changes the phase length or the microstrip line, scanning the beam by up to 40 degrees. The resulting scan loss is similar to 2dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance.

Item Type: Article
Uncontrolled keywords: Beam steering, Ferrite
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK6540 Radio > TK6570.M6 Mobile communication systems
T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics (see also: telecommunications), > TK7871.6 Antennas and waveguides
T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics (see also: telecommunications), > TK7871.6 Antennas and waveguides > TK7871.67.M53 Microwave antennas
Depositing User: John Batchelor
Date Deposited: 29 Oct 2009 08:50
Last Modified: 29 Nov 2014 15:58
Resource URI: https://kar.kent.ac.uk/id/eprint/18277 (The current URI for this page, for reference purposes)
ORCiD (Batchelor, John C.): http://orcid.org/0000-0002-5139-5765
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