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Tuohy, Simon and Podoleanu, Adrian G.H. (2010) Depth-Resolved Wavefront Aberrations using a Coherence-Gated Shack-Hartmann Wavefront Sensor. Optics Express, 18 (4). pp. 3458-3476. ISSN 1094-4087. (doi:https://doi.org/10.1364/OE.18.003458) (Full text available)

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