Shao, Jiaqing and Yan, Yong (2006) Automated Inspection of Micro Laser Spot Weld Quality using Optical Sensing and Neural Network Techniques. In: 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings. IEEE, pp. 606-610. ISBN 0-7803-9359-7. (doi:10.1109/IMTC.2006.328632) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:9112)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: http://dx.doi.org/10.1109/IMTC.2006.328632 |
Abstract
This paper presents an approach to the automated inspection of laser spot welding processes using optical sensing and neural network techniques. An optical sensor is used to derive signals covering a spectrum ranging from visible to infrared bands. A set of features extracted from the signals is fed into a neural network to classify the quality of welds. A series of experiments was carried out using a pulsed Nd:YAG laser and a common SMD (surface mounted devices) as a test component. The results obtained show that this approach can be used to inspect the laser welding quality for the microelectronics industry
Item Type: | Book section |
---|---|
DOI/Identification number: | 10.1109/IMTC.2006.328632 |
Uncontrolled keywords: | inspection; spot welding; optical sensors; neural networks; infrared sensors; infrared spectra; feature extraction; optical pulses; surface emitting lasers; testing |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) > TA165 Engineering instruments, meters etc. Industrial instrumentation |
Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
Depositing User: | Yiqing Liang |
Date Deposited: | 15 Aug 2009 10:30 UTC |
Last Modified: | 05 Nov 2024 09:41 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/9112 (The current URI for this page, for reference purposes) |
- Export to:
- RefWorks
- EPrints3 XML
- BibTeX
- CSV
- Depositors only (login required):