Koller, N., O'Leary, P., Lee, Peter Comparison of CMOS and CCD Cameras for Laser Profiling. In: Electronic Imaging Science and Technology (IS & T SPIE), 2004 January 18-22, San Jose, California, USA. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:8645)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Item Type: | Conference or workshop item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering > TK7800 Electronics |
| Institutional Unit: | Schools > School of Engineering, Mathematics and Physics > Engineering |
| Former Institutional Unit: |
Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts
|
| Depositing User: | Yiqing Liang |
| Date Deposited: | 29 Jun 2011 14:56 UTC |
| Last Modified: | 20 May 2025 10:31 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/8645 (The current URI for this page, for reference purposes) |
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