Carter, Robert M., Yan, Yong (2008) The Effect of Illumination Wavelength on the Measurement of Size Distribution of Very Small Particles Using a Novel Imaging Based System. Particle & Particle Systems Characterization, 25 (4). pp. 298-305. (doi:10.1002/ppsc.200800031) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:6369)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: https://doi.org/10.1002/ppsc.200800031 |
Abstract
This paper presents the results of an experimental investigation into the importance of illumination wavelength on measurement accuracy for an existing digital imaging based particle size analyzer. When the system was originally developed, fairly large particles were interrogated rendering the effects of illumination wavelength insignificant, but recent work has suggested that there is an interest in the scientific community in analysing particles down to a few microns in size. At these scales illumination wavelengths and particle size are of similar magnitudes, possibly leading to problems. The work presented in this paper is intended to be a practical investigation into wavelength effects using the existing system. This aim has been met firstly by introducing the basic system, along with some key past results and accuracy, then moving on to explain the wavelength tests and present new results. Two sources of illumination were used - red and blue (625 and 470 nm), Polymer micro-spheres in the 2.5-100 micron range, calibrated to NIST (National Institute of Standards and Technology) standards, were interrogated under static conditions. It is shown that whilest blue illumination does give an increase in accuracy, the effect is not marked enough to preclude the use of cost-effective red illumination at these scales.
Item Type: | Article |
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DOI/Identification number: | 10.1002/ppsc.200800031 |
Uncontrolled keywords: | imaging, image analysis, particle analysis, particle size, wavelength |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) > TA165 Engineering instruments, meters etc. Industrial instrumentation |
Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
Depositing User: | Yiqing Liang |
Date Deposited: | 28 Jul 2008 13:06 UTC |
Last Modified: | 05 Nov 2024 09:38 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/6369 (The current URI for this page, for reference purposes) |
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