Scattering Parameters and Circuit Analysis

Young, Paul R. (2007) Scattering Parameters and Circuit Analysis. In: Collier, Richard J and Skinner, Douglas, eds. Microwave Measurements, 3rd Edition. IEE Electrical Measurement . Institution of Engineering and Technology, Stevenage, pp. 19-42. ISBN 9780863417351. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Item Type: Book section
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA166 Instrumentation
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Yiqing Liang
Date Deposited: 28 Jul 2008 10:40
Last Modified: 19 May 2014 10:31
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