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Scattering Parameters and Circuit Analysis

Young, Paul R. (2007) Scattering Parameters and Circuit Analysis. In: Collier, Richard J and Skinner, Douglas, eds. Microwave Measurements, 3rd Edition. IEE Electrical Measurement . Institution of Engineering and Technology, Stevenage, pp. 19-42. ISBN 978-0-86341-735-1. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:6020)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Item Type: Book section
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA165 Engineering instruments, meters etc. Industrial instrumentation
Divisions: Faculties > Sciences > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Yiqing Liang
Date Deposited: 28 Jul 2008 10:40 UTC
Last Modified: 06 May 2020 03:01 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/6020 (The current URI for this page, for reference purposes)
Young, Paul R.: https://orcid.org/0000-0002-3707-2441
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