Young, Paul R. (2007) Scattering Parameters and Circuit Analysis. In: Collier, Richard J and Skinner, Douglas, eds. Microwave Measurements, 3rd Edition. IEE Electrical Measurement . Institution of Engineering and Technology, Stevenage, pp. 19-42. ISBN 978-0-86341-735-1. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:6020)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. |
| Item Type: | Book section |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) > TA165 Engineering instruments, meters etc. Industrial instrumentation |
| Institutional Unit: | Schools > School of Engineering, Mathematics and Physics > Engineering |
| Former Institutional Unit: |
Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts
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| Depositing User: | Yiqing Liang |
| Date Deposited: | 28 Jul 2008 10:40 UTC |
| Last Modified: | 20 May 2025 10:29 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/6020 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Young, Paul R..
| Creator's ORCID: |
 https://orcid.org/0000-0002-3707-2441
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