Yan, Yong, Dyer, Ruth (2012) Special Issue on the 2011 IEEE International Instrumentation and Measurement Technology Conference. IEEE Transactions on Instrumentation and Measurement, 61 (5). pp. 1138-1139. ISSN 0018-9456. (doi:10.1109/TIM.2012.2185722) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:46870)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1109/TIM.2012.2185722 |
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| Item Type: | Article |
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| DOI/Identification number: | 10.1109/TIM.2012.2185722 |
| Subjects: | T Technology |
| Institutional Unit: | Schools > School of Engineering, Mathematics and Physics > Engineering |
| Former Institutional Unit: |
Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts
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| Depositing User: | Tina Thompson |
| Date Deposited: | 22 Jan 2015 16:42 UTC |
| Last Modified: | 20 May 2025 10:38 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/46870 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Yan, Yong.
| Creator's ORCID: |
 https://orcid.org/0000-0001-7135-5456
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| CReDIT Contributor Roles: |
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