Sayle, D.C., Johnston, R.L. (2003) Evolutionary techniques in atomistic simulation: Thin films and nanoparticles. Current Opinion in Solid State & Materials Science, 7 (1). pp. 3-12. ISSN 1359-0286. (doi:10.1016/S1359-0286(02)00138-9) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:46810)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: http://dx.doi.org/10.1016/S1359-0286(02)00138-9 |
Abstract
Atomistic simulation has been employed to generate models with ever increasing structural complexity: often approaching those observed in real systems. Consequently, constructing such models 'by hand' becomes increasingly difficult and perhaps intractable. Accordingly, simulation methodologies, which facilitate some kind of structural evolution, are becoming more widespread. Central to these evolutionary methods is that the structures derived (potentially) depend solely on the interatomic potentials, rather than the intuition of the simulator. Here, we review some of the approaches developed.
Item Type: | Article |
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DOI/Identification number: | 10.1016/S1359-0286(02)00138-9 |
Uncontrolled keywords: | Amorphisation and recrystallisation, Atomistic simulation, Energy minimisation, Genetic algorithms, Molecular dynamics, Monte Carlo, Nanostructured materials, Simulators, Thin films, Interatomic potentials, Materials science, film thickness |
Subjects: | Q Science |
Divisions: | Divisions > Division of Natural Sciences > Physics and Astronomy |
Depositing User: | Dean Sayle |
Date Deposited: | 20 Mar 2015 16:09 UTC |
Last Modified: | 05 Nov 2024 10:30 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/46810 (The current URI for this page, for reference purposes) |
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