Accurate Non-Uniform Transmission Line Model and its Application to the De-Embedding of On-Wafer Measurements

Young, Paul R. and McPherson, D.S. and Chrisostomidis, Christos E. and Thayne, I.G. and Lucyszyn, Stepan and Robertson, Ian D. (2001) Accurate Non-Uniform Transmission Line Model and its Application to the De-Embedding of On-Wafer Measurements. IEE Proceedings: Microwaves, Antennas and Propagation, 148 (3). pp. 153-156. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

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Official URL
http://dx.doi.org/10.1049/ip-map.20010402
Item Type: Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications
Depositing User: J. Harries
Date Deposited: 19 Dec 2007 18:15
Last Modified: 17 Jul 2014 10:10
Resource URI: https://kar.kent.ac.uk/id/eprint/438 (The current URI for this page, for reference purposes)
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