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Accurate Non-Uniform Transmission Line Model and its Application to the De-Embedding of On-Wafer Measurements

Young, Paul R., McPherson, D.S., Chrisostomidis, Christos E., Thayne, I.G., Lucyszyn, Stepan, Robertson, Ian D. (2001) Accurate Non-Uniform Transmission Line Model and its Application to the De-Embedding of On-Wafer Measurements. IEE Proceedings: Microwaves, Antennas and Propagation, 148 (3). pp. 153-156. (doi:10.1049/ip-map.20010402) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1049/ip-map.20010402
Item Type: Article
DOI/Identification number: 10.1049/ip-map.20010402
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculties > Sciences > School of Engineering and Digital Arts > Broadband & Wireless Communications
Depositing User: J. Harries
Date Deposited: 19 Dec 2007 18:15 UTC
Last Modified: 28 May 2019 13:35 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/438 (The current URI for this page, for reference purposes)
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