Young, Paul R., McPherson, D.S., Chrisostomidis, Christos E., Thayne, I.G., Lucyszyn, Stepan, Robertson, Ian D. (2001) Accurate Non-Uniform Transmission Line Model and its Application to the De-Embedding of On-Wafer Measurements. IEE Proceedings: Microwaves, Antennas and Propagation, 148 (3). pp. 153-156. (doi:10.1049/ip-map.20010402) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:438)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1049/ip-map.20010402 |
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| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.1049/ip-map.20010402 |
| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering |
| Institutional Unit: | Schools > School of Engineering, Mathematics and Physics > Engineering |
| Former Institutional Unit: |
Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts
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| Depositing User: | J. Harries |
| Date Deposited: | 19 Dec 2007 18:15 UTC |
| Last Modified: | 20 May 2025 10:29 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/438 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Young, Paul R..
| Creator's ORCID: |
 https://orcid.org/0000-0002-3707-2441
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|---|---|
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