Young, Paul R. (1999) Analysing connector repeatability of microwave vector measurements. In: IEE Colloquium on Interconnections from DC to Microwaves, 1999, London. (doi:10.1049/ic:19990104) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:38958)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1049/ic:19990104 |
Abstract
This paper considers some of the problems encountered when performing an uncertainty assessment of microwave S-parameter measurements. It is shown that more rigorous techniques should be applied to S-parameter measurements due to the vector nature of the measurands
| Item Type: | Conference or workshop item (Paper) |
|---|---|
| DOI/Identification number: | 10.1049/ic:19990104 |
| Subjects: | T Technology |
| Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
| Depositing User: | Tina Thompson |
| Date Deposited: | 28 Mar 2014 15:01 UTC |
| Last Modified: | 05 Nov 2024 10:23 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/38958 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Young, Paul R..
| Creator's ORCID: |
 https://orcid.org/0000-0002-3707-2441
|
|---|---|
| CReDIT Contributor Roles: |
- Export to:
- RefWorks
- EPrints3 XML
- BibTeX
- CSV
- Depositors only (login required):
Altmetric
Altmetric
