NCR Corporation (Dayton, OH) (2009) A Method of Determining the Cause of an Error State in an Apparatus. US Patent 7,600,671. (doi:US Patent 7,600,671) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:31882)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PT... |
Abstract
A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.
Item Type: | Patent |
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DOI/Identification number: | US Patent 7,600,671 |
Subjects: | Q Science > QA Mathematics (inc Computing science) > QA 76 Software, computer programming, > QA76.76 Computer software |
Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Computing |
Depositing User: | Rogerio de Lemos |
Date Deposited: | 23 Oct 2012 23:52 UTC |
Last Modified: | 05 Nov 2024 10:14 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/31882 (The current URI for this page, for reference purposes) |
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