Oven, Robert (2010) Extraction of Phase Derivative Data from Interferometer Images using a Continuous Wavelet Transform to Determine Two-Dimensional Refractive Index Profiles. Applied Optics, 49 (22). pp. 4228-4236. ISSN 0740-3224. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)
Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterise and smooth the wavelet ridge is discussed in detail.
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK8300 Optoelectronic devices|
|Divisions:||Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications|
|Depositing User:||J. Harries|
|Date Deposited:||27 Jul 2010 14:06|
|Last Modified:||02 Jun 2014 15:59|
|Resource URI:||https://kar.kent.ac.uk/id/eprint/25156 (The current URI for this page, for reference purposes)|