Oven, Robert (2010) Extraction of Phase Derivative Data from Interferometer Images using a Continuous Wavelet Transform to Determine Two-Dimensional Refractive Index Profiles. Applied Optics, 49 (22). pp. 4228-4236. ISSN 0740-3224. (doi:10.1364/AO.49.004228) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:25156)
The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
Official URL: http://dx.doi.org/10.1364/AO.49.004228 |
Abstract
Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterise and smooth the wavelet ridge is discussed in detail.
Item Type: | Article |
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DOI/Identification number: | 10.1364/AO.49.004228 |
Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering > TK8300 Optoelectronic devices. Photoelectronic devices |
Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
Depositing User: | J. Harries |
Date Deposited: | 27 Jul 2010 14:06 UTC |
Last Modified: | 05 Nov 2024 10:05 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/25156 (The current URI for this page, for reference purposes) |
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