Vukusic, Peter S., Sambles, J. Roy, Wright, John D. (1992) Surface-plasmon resonance characterization of spin-deposited phthalocyanine films. Journal of Materials Chemistry, 2 (10). pp. 1105-1106. ISSN 0959-9428. (doi:10.1039/jm9920201105) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:22271)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1039/jm9920201105 |
Abstract
The technique of surface plasmon resonance has been used to characterize films of phthalocyanine that have been deposited by spin-coating. Results indicate a near-linear relationship between the spin speed of the substrate and the inverse of the deposited thickness of phthalocyanine.
| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.1039/jm9920201105 |
| Uncontrolled keywords: | surface plasmon resonance; spin deposition; phthalocyanine |
| Subjects: |
Q Science > QD Chemistry Q Science > QC Physics |
| Divisions: | Divisions > Division of Natural Sciences > Biosciences |
| Depositing User: | O.O. Odanye |
| Date Deposited: | 31 Aug 2009 17:57 UTC |
| Last Modified: | 05 Nov 2024 10:01 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/22271 (The current URI for this page, for reference purposes) |
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