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Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis

Barkshire, I.R., Kenny, Peter G., Fletcher, I.W., Prutton, M. (1996) Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis. Ultramicroscopy, 63 . pp. 193-203. ISSN 0304-3991. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:21381)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Item Type: Article
Subjects: Q Science > QA Mathematics (inc Computing science) > QA 76 Software, computer programming,
Divisions: Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Computing
Depositing User: Mark Wheadon
Date Deposited: 03 Sep 2009 20:15 UTC
Last Modified: 16 Feb 2021 12:31 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/21381 (The current URI for this page, for reference purposes)
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