Barkshire, I.R., Kenny, Peter G., Fletcher, I.W., Prutton, M. (1996) Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis. Ultramicroscopy, 63 . pp. 193-203. ISSN 0304-3991. (doi:10.1016/0304-3991(96)00039-3) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:21381)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: https://doi.org/10.1016/0304-3991(96)00039-3 |
|
| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.1016/0304-3991(96)00039-3 |
| Subjects: | Q Science > QA Mathematics (inc Computing science) > QA 76 Software, computer programming, |
| Institutional Unit: | Schools > School of Computing |
| Former Institutional Unit: |
Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Computing
|
| Depositing User: | Mark Wheadon |
| Date Deposited: | 03 Sep 2009 20:15 UTC |
| Last Modified: | 20 May 2025 10:08 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/21381 (The current URI for this page, for reference purposes) |
- Export to:
- RefWorks
- EPrints3 XML
- BibTeX
- CSV
- Depositors only (login required):
Altmetric
Altmetric
