Collier, Richard J. (1999) Measurement of impedance above 110 GHz. In: Harrison, P., ed. 1998 IEEE Sixth International Conference on Terahertz Electronics Proceedings. International Conference on Terahertz Electronics . IEEE, pp. 110-112. ISBN 0-7803-4903-2. (doi:10.1109/THZ.1998.731677) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:18884)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1109/THZ.1998.731677 |
Abstract
The measurement of impedance above 110 GHz lacks both commercially available measurement equipment and good standard impedances. This paper discusses these problems and goes onto suggest some ways forward for solving them. The paper includes a description of some on-wafer measurements of impedances at 140 GHz and concludes with some recommendations for future research.
| Item Type: | Book section |
|---|---|
| DOI/Identification number: | 10.1109/THZ.1998.731677 |
| Uncontrolled keywords: | measurements; impedance; on-wafer probes |
| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering > TK7800 Electronics |
| Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
| Depositing User: | M.A. Ziai |
| Date Deposited: | 15 May 2009 08:15 UTC |
| Last Modified: | 05 Nov 2024 09:55 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/18884 (The current URI for this page, for reference purposes) |
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