Skip to main content

Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films

Rigden, Jane S., Newport, Robert J., Smith, Mark E., Dirken, P.J. (1995) Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films. Materials Science Forum, 228 . pp. 525-530. ISSN 0255-5476. (doi:10.4028/ (KAR id:15973)

Language: English
Click to download this file (10MB) Preview
[thumbnail of Shallow_angle_XRD_from_in_situ_SiTi_Sol-gel_thin_films.pdf]
This file may not be suitable for users of assistive technology.
Request an accessible format
Official URL:


X-ray diffraction at shallow angles of incidence has been used to examine three silica:titania sol-gel thin films. Comparison with transmission x-ray diffraction measurements of similar materials in the bulk shows a distinct increase in disorder in the silica network. An increase in porosity of the network in thin films is also likely, suggested by an increase in Si-O-H bonds. No differences in structure between samples with differing titania contents were observed using this technique.

Item Type: Article
DOI/Identification number: 10.4028/
Subjects: Q Science
Divisions: Divisions > Division of Natural Sciences > Physics and Astronomy
Depositing User: J.M. Smith
Date Deposited: 29 Apr 2009 14:28 UTC
Last Modified: 16 Nov 2021 09:53 UTC
Resource URI: (The current URI for this page, for reference purposes)
  • Depositors only (login required):

Total unique views for this document in KAR since July 2020. For more details click on the image.