Rigden, Jane S., Newport, Robert J., Smith, Mark E., Dirken, P.J. (1995) Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films. Materials Science Forum, 228 . pp. 525-530. ISSN 0255-5476. (doi:10.4028/www.scientific.net/MSF.228-231.525) (KAR id:15973)
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| Official URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.2... |
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Abstract
X-ray diffraction at shallow angles of incidence has been used to examine three silica:titania sol-gel thin films. Comparison with transmission x-ray diffraction measurements of similar materials in the bulk shows a distinct increase in disorder in the silica network. An increase in porosity of the network in thin films is also likely, suggested by an increase in Si-O-H bonds. No differences in structure between samples with differing titania contents were observed using this technique.
| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.4028/www.scientific.net/MSF.228-231.525 |
| Subjects: | Q Science |
| Divisions: | Divisions > Division of Natural Sciences > Physics and Astronomy |
| Depositing User: | J.M. Smith |
| Date Deposited: | 29 Apr 2009 14:28 UTC |
| Last Modified: | 05 Nov 2024 09:50 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/15973 (The current URI for this page, for reference purposes) |
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