Small-Angle X-Ray-Scattering Studies Of a-Si-C-H

Rigden, Jane S. and Algar, C.D. and Newport, Robert J. and North, A.N. and Ibrahim, F. and Wilson, J.I.B. (1995) Small-Angle X-Ray-Scattering Studies Of a-Si-C-H. Journal of Non-Crystalline Solids, 190 (3). pp. 276-282. ISSN 0022-3093. (doi: ) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided)

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Small-angle X-ray scattering studies have been performed on a series of four a-Si:C:H alloys, prepared by rf glow discharge decomposition of varying proportions of propane and silane, in an attempt to elucidate their mesoscopic structure. The observed broad scattering peak has been interpreted as originating from irregular, elongated voids with a repeat distance of about 20 Angstrom and correlation length of about 25 Angstrom. The implications of this result in explaining the photo-oxidation properties of the material are also discussed.

Item Type: Article
Subjects: Q Science
Divisions: Faculties > Sciences > School of Physical Sciences > Functional Materials Group
Depositing User: J.M. Smith
Date Deposited: 07 May 2009 13:42 UTC
Last Modified: 17 Jul 2014 09:26 UTC
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