Pickup, David M. and Mountjoy, Gavin and Roberts, M.A. and Wallidge, Graham and Newport, Robert J. and Smith, Mark E. (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. Journal of Physics: Condensed Matter, 12 (15). pp. 3521-3529. ISSN 0953-8984. (doi:https://doi.org/10.1088/0953-8984/12/15/302 ) (Full text available)
In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
|Divisions:||Faculties > Sciences > School of Physical Sciences > Functional Materials Group|
|Depositing User:||J.M. Smith|
|Date Deposited:||08 May 2009 15:50 UTC|
|Last Modified:||18 Jul 2014 13:29 UTC|
|Resource URI:||https://kar.kent.ac.uk/id/eprint/15954 (The current URI for this page, for reference purposes)|