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In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate

Pickup, David M., Mountjoy, Gavin, Roberts, M.A., Wallidge, Graham, Newport, Robert J., Smith, Mark E. (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. Journal of Physics: Condensed Matter, 12 (15). pp. 3521-3529. ISSN 0953-8984. (doi:10.1088/0953-8984/12/15/302) (KAR id:15954)

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http://dx.doi.org/10.1088/0953-8984/12/15/302

Abstract

In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.

Item Type: Article
DOI/Identification number: 10.1088/0953-8984/12/15/302
Subjects: Q Science
Divisions: Faculties > Sciences > School of Physical Sciences > Functional Materials Group
Depositing User: J.M. Smith
Date Deposited: 08 May 2009 15:50 UTC
Last Modified: 27 Jan 2020 04:02 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/15954 (The current URI for this page, for reference purposes)
Mountjoy, Gavin: https://orcid.org/0000-0002-6495-2006
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