Pickup, David M., Mountjoy, Gavin, Roberts, M.A., Wallidge, Graham, Newport, Robert J., Smith, Mark E. (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. Journal of Physics: Condensed Matter, 12 (15). pp. 3521-3529. ISSN 0953-8984. (doi:10.1088/0953-8984/12/15/302) (KAR id:15954)
|
PDF
Language: English |
|
|
Download this file (PDF/2MB) |
Preview |
| Request a format suitable for use with assistive technology e.g. a screenreader | |
| Official URL: http://dx.doi.org/10.1088/0953-8984/12/15/302 |
|
| Additional URLs: |
|
Abstract
In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
| Item Type: | Article |
|---|---|
| DOI/Identification number: | 10.1088/0953-8984/12/15/302 |
| Subjects: | Q Science |
| Institutional Unit: | Schools > School of Engineering, Mathematics and Physics > Physics and Astronomy |
| Former Institutional Unit: |
Divisions > Division of Natural Sciences > Physics and Astronomy
|
| Depositing User: | J.M. Smith |
| Date Deposited: | 08 May 2009 15:50 UTC |
| Last Modified: | 20 May 2025 09:31 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/15954 (The current URI for this page, for reference purposes) |
- Link to SensusAccess
- Export to:
- RefWorks
- EPrints3 XML
- BibTeX
- CSV
- Depositors only (login required):

https://orcid.org/0000-0002-6495-2006
Altmetric
Altmetric