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Conference or workshop item
Duff, Martine C. and Lynn, Kelvin G. and Jones, Kelly and Soundararajan, Rajeswari and Bradley, John P. and Ishii, Hope and Aguiar, Jeffery and Wozniakiewicz, Penelope J. (2010) Characterization of secondary phases and other defects in CdZnTe. In: Proceedings of SPIE (Society of Photo-Optical Instrumentation Engineers). SPIE, U.S. ISBN 978-0-8194-8301-0. (doi:https://doi.org/10.1117/12.862379) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) |