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Zhai, Xiaojun, Appiah, Kofi, Ehsan, Shoaib, Howells, Gareth, Hu, Huosheng, Gu, Dongbing, McDonald-Maier, Klaus (2015) Exploring ICMetrics to detect abnormal program behaviour on embedded devices. Journal of Systems Architecture, 61 (10). pp. 567-575. ISSN 1383-7621. (doi:10.1016/j.sysarc.2015.07.007) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:52454)

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