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Impact of absorption in the top layer of a two layer sample on spectroscopic spectral domain interferometry of the bottom layer

Fleischhauer, F. and Feuchter, T. and Leick, L. and Rajendram, R. and Podoleanu, A. (2018) Impact of absorption in the top layer of a two layer sample on spectroscopic spectral domain interferometry of the bottom layer. In: Podoleanu, Adrian G.H. and Bang, Ole, eds. 2nd Canterbury Conference on OCT with Emphasis on Broadband Optical Sources. Proceedings of SPIE . SPIE. ISBN 978-1-5106-1674-5. E-ISBN 978-1-5106-1675-2. (doi:10.1117/12.2281928)

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Abstract

Spectroscopic spectral domain interferometry and spectroscopic optical coherence tomography combine depth information with spectrally-resolved localised absorption data. These additional data can improve diagnostics by giving access to functional information of the investigated sample. One possible application is measuring oxygenation levels at the retina for earlier detection of several eye diseases. Here measurements with different hollow glass tube phantoms are shown to measure the impact of a superficial absorbing layer on the precision of reconstructed attenuation spectra of a deeper layer. Measurements show that a superficial absorber has no impact on the reconstructed absorption spectrum of the deeper absorber. Even when diluting the concentration of the deeper absorber so far that an incorrect absorption maximum is obtained, still no influence of the superficially placed absorber is identified.

Item Type: Book section
DOI/Identification number: 10.1117/12.2281928
Uncontrolled keywords: (110.4500) Optical coherence tomography; (300.6170) Spectroscopy - Spectra
Divisions: Faculties > Sciences > School of Physical Sciences > Applied Optics Group
Depositing User: F.T. Fleischhauer
Date Deposited: 21 Mar 2018 10:47 UTC
Last Modified: 24 Jul 2019 09:22 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/66493 (The current URI for this page, for reference purposes)
Podoleanu, A.: https://orcid.org/0000-0002-4899-9656
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