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100 kHz Mueller polarimeter in reflection configuration

Le Gratiet, Aymeric, Rivet, Sylvain, Dubreuil, Matthieu, Le Grand, Yann (2015) 100 kHz Mueller polarimeter in reflection configuration. Optics Letters, 40 (4). pp. 645-648. ISSN 0146-9592. (doi:10.1364/OL.40.000645) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:60111)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Official URL
http://doi.org/10.1364/OL.40.000645

Abstract

A new setup is proposed to perform high-speed Mueller polarimetry by spectral coding of polarization in a reflection configuration. The system uses a swept laser source and a photodiode, which results in a simple optical setup that allows measurement of Mueller matrices at 100 kHz repetition rate. A special focus is made on the influence of the cube beam splitter polarimetric response, which is essential to measurements in a reflection configuration. The instrument is first validated on reference samples for single-point measurements, and the effect of a proper system calibration is also demonstrated on polarimetric images. The device is intended to be implemented within a laser scanning microscope to perform multimodal imaging (confocal/multiphoton and Mueller polarimetry).

Item Type: Article
DOI/Identification number: 10.1364/OL.40.000645
Divisions: Faculties > Sciences > School of Physical Sciences
Depositing User: Matthias Werner
Date Deposited: 26 Jan 2017 15:48 UTC
Last Modified: 29 May 2019 18:36 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/60111 (The current URI for this page, for reference purposes)
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