Automatic Measures for Predicting Performance in Off-Line Signature

Alonso-Fernandez, Fernando and Fairhurst, Michael and Fierrez, Julian and Ortega-Garcia, Javier (2007) Automatic Measures for Predicting Performance in Off-Line Signature. In: IEEE Proceedings: International Conference on Image Processing, 2007 September, San Antonio TX, USA. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Item Type: Conference or workshop item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics (see also: telecommunications) > TK7880 Applications of electronics (inc industrial & domestic) > TK7882.B56 Biometrics
T Technology > TA Engineering (General). Civil engineering (General) > TA1637 Image Analysis, Image Processing
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Image and Information Engineering
Depositing User: Yiqing Liang
Date Deposited: 13 Aug 2008 11:26
Last Modified: 04 Jul 2014 11:35
Resource URI: https://kar.kent.ac.uk/id/eprint/6007 (The current URI for this page, for reference purposes)
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