Automatic Measures for Predicting Performance in Off-Line Signature

Alonso-Fernandez, Fernando and Fairhurst, Michael and Fierrez, Julian and Ortega-Garcia, Javier (2007) Automatic Measures for Predicting Performance in Off-Line Signature. In: IEEE Proceedings: International Conference on Image Processing, 2007 September, San Antonio TX, USA. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)

Item Type:	Conference or workshop item (Paper)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics (see also: telecommunications) > TK7880 Applications of electronics (inc industrial & domestic) > TK7882.B56 Biometrics T Technology > TA Engineering (General). Civil engineering (General) > TA1637 Image Analysis, Image Processing
Divisions:	Faculties > Sciences > School of Engineering and Digital Arts > Image and Information Engineering
Depositing User:	Yiqing Liang
Date Deposited:	13 Aug 2008 11:26 UTC
Last Modified:	04 Jul 2014 11:35 UTC
Resource URI:	https://kar.kent.ac.uk/id/eprint/6007 (The current URI for this page, for reference purposes)