Skip to main content

Engineering of nanoscale defect patterns in CeO2nanorods via ex situ and in situ annealing

Sakthivel, Tamil Selvan, Reid, David L., Bhatta, Umananda M., Möbus, Günter, Sayle, Dean C., Seal, Sudipta (2015) Engineering of nanoscale defect patterns in CeO2nanorods via ex situ and in situ annealing. Nanoscale, 7 (12). pp. 5169-5177. ISSN 2040-3364. E-ISSN 2040-3372. (doi:10.1039/C4NR07308H) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided)

PDF - Publisher pdf
Restricted to Repository staff only
Contact us about this Publication Download (1MB)
[img]
Official URL
http://doi.org/10.1039/C4NR07308H
Item Type: Article
DOI/Identification number: 10.1039/C4NR07308H
Subjects: Q Science > QD Chemistry > QD473 Physical properties in relation to structure
Divisions: Faculties > Sciences > School of Physical Sciences > Functional Materials Group
Depositing User: Dean Sayle
Date Deposited: 19 Apr 2017 08:34 UTC
Last Modified: 29 May 2019 17:08 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/54704 (The current URI for this page, for reference purposes)
Sayle, Dean C.: https://orcid.org/0000-0001-7227-9010
  • Depositors only (login required):

Downloads

Downloads per month over past year