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Engineering of nanoscale defect patterns in CeO2nanorods via ex situ and in situ annealing

Sakthivel, Tamil Selvan, Reid, David L., Bhatta, Umananda M., Möbus, Günter, Sayle, Dean C., Seal, Sudipta (2015) Engineering of nanoscale defect patterns in CeO2nanorods via ex situ and in situ annealing. Nanoscale, 7 (12). pp. 5169-5177. ISSN 2040-3364. E-ISSN 2040-3372. (doi:10.1039/C4NR07308H) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided) (KAR id:54704)

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Official URL
http://doi.org/10.1039/C4NR07308H
Item Type: Article
DOI/Identification number: 10.1039/C4NR07308H
Subjects: Q Science > QD Chemistry > QD473 Physical properties in relation to structure
Divisions: Divisions > Division of Natural Sciences > School of Physical Sciences
Depositing User: Dean Sayle
Date Deposited: 19 Apr 2017 08:34 UTC
Last Modified: 16 Feb 2021 13:34 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/54704 (The current URI for this page, for reference purposes)
Sayle, Dean C.: https://orcid.org/0000-0001-7227-9010
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