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Electronic Traps in Polymer Insulators: I (V) characteristics

Marcelli, Gianluca, Meunie, M, Quirke, N (2002) Electronic Traps in Polymer Insulators: I (V) characteristics. IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena, (V). pp. 40-43. ISSN 0084-9162. (doi:10.1109/CEIDP.2002.1048731) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1109/CEIDP.2002.1048731

Abstract

We present three methods to estimate current-voltage characteristics of insulators starting from a description of the electronic traps in the dielectric. The methods are: (1) analytic and numerical solutions of the Kubo equation, (2) computation of local electron mobilities from a multiple trapping electron transport code (TrAM, Transport in Amorphous Materials) which includes trap filling effects and macroscopic integration of the Poisson's and current-field equations, using local electron mobility data from TrAM and (3) direct incorporation of the local field in TrAM removing the need for the assumption of space charge limited conduction. We compare our model results with experimental studies of the current-voltage curve of cross-linked polyethylene.

Item Type: Article
DOI/Identification number: 10.1109/CEIDP.2002.1048731
Subjects: Q Science > QC Physics > QC173.45 Condensed Matter
Divisions: Faculties > Sciences > School of Engineering and Digital Arts
Faculties > Sciences > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Gianluca Marcelli
Date Deposited: 11 Nov 2015 11:10 UTC
Last Modified: 29 May 2019 16:17 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/51537 (The current URI for this page, for reference purposes)
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