'Defect evaluation using the phase information of an EC-GMR Sensor'

Gao, P and Wang, Chao and Li, Y and LI, FW and Yan, Yong and Hu, Yonghui (2014) 'Defect evaluation using the phase information of an EC-GMR Sensor'. In: IEEE International Instrumentation and Measurement Technology Conference, 12-15 May 2014, Montevideo, Uruguay. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Item Type: Conference or workshop item (Paper)
Subjects: T Technology
Divisions: Faculties > Sciences > School of Engineering and Digital Arts
Faculties > Sciences > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Tina Thompson
Date Deposited: 08 Jul 2014 11:27 UTC
Last Modified: 22 Oct 2014 09:58 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/41707 (The current URI for this page, for reference purposes)
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