Cox, Maurice G. and Dainton, Mark P. and Harris, P.M. and Ridler, Nick M. and Young, Paul R. (2000) A generalised treatment of the calibration and measurement for vector indicating microwave reflectometers. In: Conference on Precision Electromagnetic Measurements. IEEE, pp. 160-161. ISBN 0-7803-5744-2. (doi:10.1109/CPEM.2000.850927) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:38949)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: http://dx.doi.org/10.1109/CPEM.2000.850927 |
Abstract
This paper gives a generalised treatment of the calibration and measurement of vector-indicating microwave reflectometers. The reflection coefficient is treated as a complex measurand with an elliptical region of uncertainty. The reflectometer calibration is treated as (i) a deterministic problem, and (ii) an overdetermined problem employing generalised distance regression.
| Item Type: | Book section |
|---|---|
| DOI/Identification number: | 10.1109/CPEM.2000.850927 |
| Uncontrolled keywords: | calibration; microwave measurements; equations; reflection; covariance matrix; uncertainty; laboratories; joining processes; linear systems; matrices |
| Subjects: | T Technology |
| Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
| Depositing User: | Tina Thompson |
| Date Deposited: | 28 Mar 2014 12:48 UTC |
| Last Modified: | 16 Nov 2021 10:15 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/38949 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Young, Paul R..
| Creator's ORCID: |
 https://orcid.org/0000-0002-3707-2441
|
|---|---|
| CReDIT Contributor Roles: |
- Export to:
- RefWorks
- EPrints3 XML
- BibTeX
- CSV
- Depositors only (login required):
Altmetric
Altmetric
