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A generalised treatment of the calibration and measurement for vector indicating microwave reflectometers

Cox, Maurice G. and Dainton, Mark P. and Harris, P.M. and Ridler, Nick M. and Young, Paul R. (2000) A generalised treatment of the calibration and measurement for vector indicating microwave reflectometers. In: Conference on Precision Electromagnetic Measurements. IEEE, pp. 160-161. ISBN 0-7803-5744-2. (doi:10.1109/CPEM.2000.850927) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1109/CPEM.2000.850927

Abstract

This paper gives a generalised treatment of the calibration and measurement of vector-indicating microwave reflectometers. The reflection coefficient is treated as a complex measurand with an elliptical region of uncertainty. The reflectometer calibration is treated as (i) a deterministic problem, and (ii) an overdetermined problem employing generalised distance regression.

Item Type: Book section
DOI/Identification number: 10.1109/CPEM.2000.850927
Uncontrolled keywords: calibration; microwave measurements; equations; reflection; covariance matrix; uncertainty; laboratories; joining processes; linear systems; matrices
Subjects: T Technology
Divisions: Faculties > Sciences > School of Engineering and Digital Arts > Broadband & Wireless Communications
Depositing User: Tina Thompson
Date Deposited: 28 Mar 2014 12:48 UTC
Last Modified: 01 Aug 2019 09:03 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/38949 (The current URI for this page, for reference purposes)
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