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A sliding mode observer for fault reconstruction under output sampling: A time-delay approach

Han, X. and Fridman, Emilia and Spurgeon, Sarah K. (2011) A sliding mode observer for fault reconstruction under output sampling: A time-delay approach. In: IEEE Conference on Decision and Control and European Control Conference. IEEE, pp. 77-82. ISBN 978-1-61284-800-6. E-ISBN 978-1-61284-801-3. (doi:10.1109/CDC.2011.6160659) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1109/CDC.2011.6160659

Abstract

A sliding mode observer in the presence of sampled output information and its application to fault reconstruction is studied. The observer is designed by using the delayed continuous-time representation of the sampled-data system, for which a set of Linear Matrix Inequalities (LMIs) provide conditions for the ultimate boundedness. It is shown that an ideal sliding motion cannot be achieved in the observer when outputs are sampled. However, ultimately bounded solutions can be obtained provided the sampling frequency is fast enough. The bound on the solution is proportional to the sampling time and the magnitude of the switching gain. The proposed observer design is applied to the problem of fault reconstruction under sampled output. It is shown that, for a sufficiently small value of ?, a perturbation parameter, a transducer or sensor fault can be reconstructed reliably from the output error dynamics. An example of observer design for an inverted pendulum system is used to demonstrate the merit of the proposed methodology compared to existing sliding mode observer design approaches.

Item Type: Book section
DOI/Identification number: 10.1109/CDC.2011.6160659
Additional information: 12 volumes
Uncontrolled keywords: observers; delay; educational institutions; switches; linear matrix inequalities; accuracy; reliability
Subjects: T Technology
Divisions: Faculties > Sciences > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Tina Thompson
Date Deposited: 30 Oct 2013 16:54 UTC
Last Modified: 07 Oct 2019 10:38 UTC
Resource URI: https://kar.kent.ac.uk/id/eprint/35848 (The current URI for this page, for reference purposes)
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