Oven, Robert (2009) Measurement of Two Dimensional Refractive Index Profiles of Channel Waveguides using an Interferometric Technique. Applied Optics, 48 (30). pp. 5704-5712. ISSN 1559-128X. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)
Two dimensional refractive index profiles of ion exchanges channel waveguides in glass have been measured using an interferometric method. In order to obtain depth data, a shallow bevel is produced in the glass by polishing. A regularization algorithms for the extraction of the phase data from the interferometer image is presented. The method is applied to waveguides formed by the electric field assisted diffusion of Cu+ ions into a borosilicate glass. The index change obtained from the interferometer is in good agreement with that obtained from measurements on planar waveguides.
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK8300 Optoelectronic devices|
|Divisions:||Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications|
|Depositing User:||J. Harries|
|Date Deposited:||10 Nov 2009 11:47|
|Last Modified:||02 Jun 2014 16:00|
|Resource URI:||https://kar.kent.ac.uk/id/eprint/23274 (The current URI for this page, for reference purposes)|