Local structure of saccharose- and anthracene-based carbons studied by wide-angle high-energy X-ray scattering

Szczygielska, A. and Burian, A. and Dore, John C. and Honkimaki, V. and Duber, S. (2002) Local structure of saccharose- and anthracene-based carbons studied by wide-angle high-energy X-ray scattering. In: 6th International School and Symposium onSynchrotron Radiation in Natural Science, JUN 17-22, 2002, Ustron Jaszowiec, Poland. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

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A series of porous carbon materials, produced by pyrolysis of saccharose and anthracene and heat treated at 1000, 1900 and 2300 degreesC have been studied by wide-angle X-ray scattering. The X-ray data were collected at European Synchrotron Radiation Facility (ESRF) in Grenoble on the ID15Angstrom beam line (high-energy X-ray diffraction) using a wavelength of E = 116.2 keV, lambda = 0.1067 Angstrom. The data were recorded in the scattering vector range from 0.5 to 24 Angstrom(-1) which enabled them be converted to a real-space representation via the Fourier transform. The structure of these carbons has been described in terms of a model based on disordered, graphite-like layers with very weak interlayer correlations. At higher temperatures the anthracene-based carbon transforms into graphite while the carbon produced from saccharose remains disordered. The graphitization process has been studied in detail by careful analysis of the diffraction data in real and reciprocal space. (C) 2003 Elsevier B.V. All rights reserved.

Item Type: Conference or workshop item (UNSPECIFIED)
Subjects: Q Science
Divisions: Faculties > Science Technology and Medical Studies > School of Physical Sciences
Depositing User: Maggie Francis
Date Deposited: 11 Mar 2009 22:42
Last Modified: 16 May 2014 14:49
Resource URI: https://kar.kent.ac.uk/id/eprint/13414 (The current URI for this page, for reference purposes)
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