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Conference or workshop item
Koller, N. and O'Leary, P. and Lee, Peter Comparison of CMOS and CCD Cameras for Laser Profiling. In: Electronic Imaging Science and Technology (IS & T SPIE), 2004 January 18-22, San Jose, California, USA. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) |