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Conference or workshop item
| de Oliveira, Marcelo V. and Estefhan, D. Wandekokem and Mendel, Eduardo and Fabris, Fabio and Flavio, M. Varejao and Thomas, W. Rauber and Rodrigo, J. Batista (2010) Constructing feature-based ensemble classifiers for real-world machines fault diagnosis. In: IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society, 7-10 Nov. 2010, Glendale, AZ. (doi:https://doi.org/10.1109/IECON.2010.5675522) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) |
