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Article

Sakthivel, Tamil Selvan and Reid, David L. and Bhatta, Umananda M. and Möbus, Günter and Sayle, Dean C. and Seal, Sudipta (2015) Engineering of nanoscale defect patterns in CeO2nanorods via ex situ and in situ annealing. Nanoscale, 7 (12). pp. 5169-5177. ISSN 2040-3364. E-ISSN 2040-3372. (doi:https://doi.org/10.1039/C4NR07308H) (Access to this publication is currently restricted. You may be able to access a copy if URLs are provided)

Sakthivel, Tamil Selvan and Reid, David L. and Bhatta, Umananda M. and Möbus, Günter and Sayle, Dean C. and Seal, Sudipta (2015) Engineering of nanoscale defect patterns in CeO2 nanorods via ex situ and in situ annealing. Nanoscale, 7 (12). pp. 5169-5177. ISSN 2040-3364. E-ISSN 2040-3372. (doi:https://doi.org/10.1039/C4NR07308H) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided)

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