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Burke, Terry and Huxley, D.W. and Newport, Robert J. and Cernik, R. (1992) An Insitu X-Ray-Diffraction Method For The Structure Of Amorphous Thin-Films Using Shallow Angles Of Incidence. Review of Scientific Instruments, 63 (1 Part). pp. 1150-1152. ISSN 0034-6748. (Full text available)

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