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Burke, T.M. and Huxley, D.W. and Newport, R.J. and Cernik, R. (1992) An Insitu X-Ray-Diffraction Method For The Structure Of Amorphous Thin-Films Using Shallow Angles Of Incidence. REVIEW OF SCIENTIFIC INSTRUMENTS , 63 (1 Part). pp. 1150-1152. ISSN 0034-6748. (Full text available)
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