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Number of items: 8.

Article

de Lemos, Rogério and Timmis, Jon and Ayara, Modupe and Forrest, Simon (2007) Immune-inspired adaptable error detection for automated teller machines. IEEE Transactions on Systems, Man and Cybernetics, Part C: Applications and Reviews, 37 (5). pp. 873-886. ISSN 1094-6977. (Access to this publication is restricted)
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Conference or workshop item

Ayara, Modupe and Timmis, Jon and de Lemos, Rogério and Forrest, Simon (2005) Immunising Automated Teller Machines. In: Artificial Immune Systems. pp. 404-417. (The full text of this publication is not available from this repository)

Ayara, Modupe and Timmis, Jon and de Lemos, Rogério and de Castro, Leandro N. and Duncan, Ross (2003) Tolerating Faults in Embedded Systems Based on Artificial Immune Systems. In: Fast Abstracts Supplement of the 4th European Dependable Computing Conference (EDCC-4), October 23-25, 2002, Toulouse, France. (The full text of this publication is not available from this repository)

Timmis, Jon and de Lemos, Rogério and Ayara, Modupe and Duncan, Ross (2002) Towards Immune Inspired Fault Tolerance in Embedded Systems. In: Proceedings of 9th International Conference on Neural Information Processing, November 18-22, 2002, Orchid Country Club Singapore. (Full text available)
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Ayara, Modupe and Timmis, Jon and de Lemos, Rogério and de Castro, Leandro N. and Duncan, Ross (2002) Negative Selection: How to Generate Detectors. In: Timmis, Jon and Bentley, Peter J., eds. ICARIS 2002. Unversity of Kent at Canterbury Printing Unit, University of Kent at Canterbury pp. 89-98. ISBN 1902671325. (The full text of this publication is not available from this repository)

Thesis

Ayara, Modupe (2005) An Immune-Inspired Solution for Adaptable Error Detection in Embedded Systems. Doctor of Philosophy (PhD) thesis, Computing Laboratory. (The full text of this publication is not available from this repository)

Patent

NCR Corporation (Duluth, GA) (2010) A Method of and System for Prediction of the State of Health of an Apparatus. US Patent 7,815,103. (The full text of this publication is not available from this repository)

NCR Corporation (Dayton, OH) (2009) A Method of Determining the Cause of an Error State in an Apparatus. US Patent 7,600,671. (The full text of this publication is not available from this repository)

This list was generated on Sat Oct 25 14:34:37 2014 BST.