Chadwick, A.V. and Savin, S.L.P. (2003) Restricting the high-temperature growth of nanocrystalline tin oxide. RADIATION EFFECTS AND DEFECTS IN SOLIDS , 158 (1-6). pp. 73-76. ISSN 1042-0150 .
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The sensitivity of tin oxide is dependent on various factors, one of which is the grain size. Three methods have been investigated with the aim of stabilising the grain size in the nanometer range, namely; (i) encapsulation within a silica matrix, (ii) coating the crystallites with hexamethyldisilazane and (iii) pinning the grain boundaries with a second metal oxide nanocrystal. The resulting materials have been characterised by X-ray powder diffraction (XRPD), Extended X-ray absorption fine structure (EXAFS) and conductivity measurements.
|Divisions:||Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group
Faculties > Science Technology and Medical Studies > School of Physical Sciences
|Depositing User:||Alan Chadwick|
|Date Deposited:||15 Sep 2008 11:17|
|Last Modified:||06 Sep 2011 00:22|
|Resource URI:||http://kar.kent.ac.uk/id/eprint/9392 (The current URI for this page, for reference purposes)|
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