Scattering Parameters and Circuit Analysis

Young, P.R. (2007) Scattering Parameters and Circuit Analysis. In: Collier, Richard and Skinner, Douglas, eds. Microwave Measurements, 3rd Edition. IEE Electrical Measurement . Institution of Engineering and Technology, Stevenage, pp. 19-42. ISBN 9780863417351. (The full text of this publication is not available from this repository)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Item Type: Book section
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA166 Instrumentation
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Instrumentation, Control and Embedded Systems
Depositing User: Yiqing Liang
Date Deposited: 28 Jul 2008 10:40
Last Modified: 14 Jan 2010 14:22
Resource URI: http://kar.kent.ac.uk/id/eprint/6020 (The current URI for this page, for reference purposes)
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